Authors: A. Inbar, J. Birkbeck, J. Xiao, T. Taniguchi, K. Watanabe, B. Yan, Y. Oreg, Ady Stern, E. Berg & S. Ilani
Summary: This paper discusses a novel type of microscopy which uses a van der Waals tip held at an angle vs the sample that can probe in reciprocal space to measure the band structure along a line in k-space. The most interesting thing to me is that this is the first demonstration I have seen of actual twistronic devices being useful and having real life applications. Additionally, because this system is inherently sensitive to twisted layers, it can be used to measure an interface between monolayer graphene sheets in situ as the angle is changing. A very neat looking paper demonstrating a cool technique that may have applications for 2D folks.
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